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Bruker Opus Manual [Unlimited EPub]OPUS Viewer: OPUS Viewer is a free program that can open all kinds of Bruker's OPUS, JCAMP-DX and Galactic Grams files while data processing and evaluation is not possible. It allows you to display spectral data (spectra, interferograms etc.) as well as other data saved together with the spectrum such as reports with evaluation results, measurement parameters, audit trails, signatures etc. There is no installer or setup program required. Just extract the contents of the zip archive to a directory of your choice, then directly run the executable Opus.exe from there. IMPORTANT: If on the same computer there is already an existing installation of the full OPUS version, please do NOT install the OPUS Viewer. Download OPUS Viewer OPUS for Linux: free beta version with rather limited functionality. Use it free for your evaluation but also at your own risk. No support from Bruker Optics. Download OPUS Linux Download Guide for Infrared Spectroscopy OPUS Error Reporting: if you encounter any trouble or bugs with OPUS the official email address to report this is opusbugs(at)bruker.com. In case of more complex problems we have put together some guide lines and instructions on how to collect and report the information that really helps us locating and fixing possible issues. Download OPUS error reporting instructions. Is it a weighted mean of a Lorentz and Gauss. Question 2 answers Feb 19, 2018 When using the Band Fitting feature of OPUS you can choose between several options according to the peak type. A Lorentzian is an ideal lineshape for a homogeneous transition, but this is often inhomogeneouly broadened, better described by a Gaussian lineshape.Question 21 answers Apr 14, 2014 I tried OPUS viewer, but it does not allow to save or import spectra in other format. Alltogether nearly 60 file types from 30 manufacturers of UV-VIS, NIR, FTIR, Raman, fluorescence and XRF spectrometers. You're welcome!http://www.professional-tuner.at/uploaded/constellation-vision-system-operator-s-manual.xml
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View 200 Recommendations Does anyone have experience editing OPUS 7 3D plots of FTIR data. Question 13 answers Feb 8, 2014 Specifically, our gridded FTIR-ATR runs have points with bad contacts, rendering those spectra useless (fringing effects, etc). We want to edit those few data points out but still produce a nice 3D map (albeit with a few holes). I've tried extracting a new 3D plot minus those blocks, but OPUS won't let me plot them except as columns or spots. Any suggestions? I have some experience with MATLAB, but I'm looking for a more elegant solution on OPUS. Thank you for your answers. Relevant answer Peter Lasch Sep 27, 2016 Answer Dear Guillaume, I only just noticed your question. OPUS map files can be imported in CytoSpec and stored in a Matlab compatible data format. The demo version of CytoSpec is free of charge (limited functionality, runs for 90 days, registration will be required). Best regards, -Peter View 0 Recommendations Fatemeh Babaei asked a question related to OPUS Is it proper to make an average spectrum of different replicates of one groups and compare to the others.Question 5 answers Apr 25, 2016 I am using Vertex700 (Bruker) and want to compare the starch spectrum extracted from different groups. I would like to know if I can do it in the spectroscopy field. If yes, how can I do it by OPUS. Thanks Relevant answer Stella Nunziante Cesaro Apr 27, 2016 Answer I am also using a Bruker instrument and I agrre with the answer of Alexandra Domanskaya View 5 Recommendations Manas Dash asked a question related to OPUS How can we run OMNIC series file (Thermo Nicolet NEXUS 870) in OPUS (Brucker, Vertex 80v). Search for more research, methods, and experts in other areas on ResearchGate. Discover more research Advertisement or Discover by subject area Recruit researchers Join for free Login Email Tip: Most researchers use their institutional email address as their ResearchGate login Password Forgot password.http://www.rusbilding.ru/userfiles/constipation-manual-removal.xml Keep me logged in Log in or Continue with LinkedIn Continue with Google Welcome back. Keep me logged in Log in or Continue with LinkedIn Continue with Google No account. All rights reserved. Terms Privacy Copyright Imprint. Checking your browser before accessing This process is automatic. Your browser will redirect to your requested content shortly. Bruker developed the CMET process software as an independent platform, using the OPUS software for spectrometer communication and evaluation tasks. Embedded watchdog functionality restarts the software in case of an incident without operator interference. CMET consists of a setup interface and a runtime environment. The setup interface with its modular and flexible interface incorporates all necessary functionalities to setup a scenario for any kind of batch and continuous applications. This includes the spectrometer setup, product setup, defining the input-output communication protocols as well as the scenario setup. Inside the scenario setup everything is combined and the user can assign a specific spectrometer, with a specific measurement channel to a specific product. If necessary, external triggers can be defined, allowing the implementation of targeted measurement strategies. After the configuration is complete, the runtime software is executed. This software provides a complete overview of the running scenarios including the current task as well as trend charts regarding all specified products. The visualization of the trend charts is implemented inside a browser application, where all current results can be displayed and analyzed. CMET offers the most common industry standard interfaces which allow it to be integrated in any process control environment, using a wide range of standard communication protocols, including: 4-20 mA Modbus Profibus DP OPC Download: CMET Flyer CMET: Software for Inline Process Control (Flyer EN) 0.http://ninethreefox.com/?q=node/169229 MB For this purpose Bruker offers a dedicated software package for reaction monitoring providing appropriate functionality. Setup of continuous Measurements for monitoring and analysis of chemical reactions 2D and 3D Spectra Plots in real time with intuitive and smart visualization options Spectra Evaluation using multivariate methods in real time Interactive Setup of Integration Methods in advance and during reaction monitoring PCA (Principal Component Analysis) for easy trending and data analysis Combination of classical and multivariate data analysis tools in one software package including different options for data pretreatment Event Viewer including spectral Information, data extraction options and editable remarks for the reaction protocol Different Modes for End Point Determination (manual or automatic), including options to monitor post reaction sequences Automatic End Point Detection based on either PCA or integration results Please contact us for more information Please contact us for more information. Innovation with Bruker Optics is continually improving its products and reserves the right to change specifications without notice. Low-cost, small footprint FT-IR spectrometer. Detailed Specifications for ALPHA FT-IR Spectrometer from Bruker. The ALPHA II is a compact and modular FTIR spectrometer with highest build-quality. Francisco Zaera Group. Prepared by Lora Shorthouse, November 2011 Fourier-transform infrared (FTIR) instrument used for this system is a Bruker.http://anapanic.com/images/canon-gp200-service-manual.pdf All S1 TRACER XRF analyzers are calibrated with NIST traceable alloy standards unless the client’s application is not intended for alloys. Average the chemistry results. The results for each element should be within the tolerance range specified on the corresponding calibration sheet. After a User Library has been created and saved, the User Library Maintenance screen will appear similar to the illustration of Figure 6.9. The user password may also be changed beginning from the “System Setup” screen. Scroll up and down the list until the desired COM port is found. In most cases, the default value, COM1, is applicable. Be sure you record your selected password in a safe place away from the analyzer, as Bruker AXS Handheld cannot recover a lost user password. See section 6.4 and figure 6.13. Ensure that the Instrument Port is set to “Comm 1.”. DO NOT attempt to look into the nose of the analyzer to see if X-rays are being generated. Contact a Bruker AXS Handheld representative for more information.The concepts have been simplified to give a basic picture of what radiation is and how it applies to operators of the Bruker XRF Analyzer. The basic unit of every element is the atom. Primary Beam: Ionizing radiation from an X-ray tube that is directed through an aperture in the radiation source housing for use in conducting X-ray fluorescence measurements. As human beings, we have evolved in the presence of ionizing radiation from natural background radiation. Terrestrial Radiation There are natural sources of radiation in the soil, rocks, building materials, and drinking water. This is the largest group of people to receive significant doses of radiation. Biological Effects of Radiation A.9.1 Cell Sensitivity Cell Sensitivity Cell Sensitivity Cell Sensitivity The human body is composed of billions of living cells. To date, only plants and animals have exhibited signs of heritable effects from radiation. While it has been suggested that such exposures may also increase the risk of childhood cancer, this has not yet been proven. It consists of a cylindrical chamber filled with air and an insulated wire running through its center length with a voltage applied between the wire and outside cylinder. When radiation passes through the chamber, ion pairs are extracted and build up a charge. The measured dose recorded by this device may be used as the worker's legal occupational extremity exposure. The MPS-400E Mobile Scanner was developed forThis new system operates using the very latest XRF Sensor and computing technologies and provides endFollowing data acquisition users can perform on-demandAdditional analysis is supported through data export options that areTables are available for scanning loose parts and sample cups. This new unit provides our customers with a benchtop solution for XRF operations in both bottom-up and top-down scanning modes.The BTA-100 provides an excellentProcess commands between the SPLC and the XIS are solicited by the SPLC using the Industrial Modbus TCP protocol. Also, local management of analysis methods and post-processing of elemental concentration is supported.Standard and custom sizes are availableOur products. XRF is based on the principle that individual atoms, when excited by an external energy source, emit X-ray photons of a characteristic energy or wavelength. By counting the number of photons of each energy emitted from a sample, the elements present may be identified and quantitated. Moseley in 1912 discovered a mathematical relationship between the element’s emitted X-ray frequency and its atomic number. In 1925 Coster and Nishina were the first to use primary X-rays instead of electrons to excite a sample.AUTOSKOLA-SCP.COM/files/Docucentre-C3370-Manual(1).pdf After Glocker and Schreiber were the first to perform quantitative analysis of materials using XRF in 1928, detector technology had to catch up in order to make the technique practical, which didn’t begin to happen until the 1940’s. The 1950’s saw the first commercially produced X-ray spectrometers. In 1970, the lithium drifted silicon detector was developed, and this technology is still in use today (Jenkins 1988: 51-53). The analysis is rapid and usually sample preparation is minimal or not required at all. These instruments are used primarily for the provenance research on obsidian artifacts from around the world, but they are also used in special circumstances for the non-destructive analysis of other materials such as metals, ceramic paints, and soils. The emitted quanta of radiation are X-ray photons whose specific energies permit the identification of their source atoms. To understand this phenomenon, we must first look at how X-rays are generated. This radiation, called bremsstrahlung, or “braking radiation”, is the result of the deceleration of the electrons inside the material. The bremsstrahlung continuum is illustrated as a function of electron acceleration voltages for a molybdenum target in Figure 1. This ejected electron leaves a “hole” in the electronic structure of the atom, and after a brief period, the atomic electrons rearrange, with an electron from a higher energy shell filling the vacancy. By way of this relaxation the atom undergoes fluorescence, or the emission of an X-ray photon whose energy is equal to the difference in energies of the initial and final states. Detecting this photon and measuring its energy allows us to determine the element and specific electronic transition from which it originated (Jenkins 1988: 4-6, Anzelmo 1987 Part 1). Herein lies the basis for XRF spectrometry, where elements may be quantitated based on the rate of emission of their characteristic X-rays from a sample that is being excited. Thus there are multiple types of allowed transitions that occur which are governed by the laws of quantum mechanics, each transition having its own specific energy or line (Jenkins 1988: 6). The three main types of transitions or spectral series are labeled K, L, or M, corresponding to the shell from which the electron was initially removed.As shown in Figure 1, once the excitation energy of the incident electron beam exceeds the Mo K transition energies these lines begin to appear in the tube spectrum. It competes with the Auger effect, which results in emission of a second photoelectron to regain stability. The relative numbers of excited atoms that fluoresce are described by the fluorescence yield, which increases with increasing atomic number for all three series (Jenkins 1988: 6). High-energy X-ray photons can create the same effect, allowing us to excite a sample with the output of an X-ray tube or any source of photons of the proper energy. In fact, in some applications of XRF spectrometry, X-rays from a tube are used to excite a secondary fluorescer, which emits photons that in turn are used to excite the sample. When an X-ray is scattered with no change in energy this is called Rayleigh scattering, and when a random amount of energy is lost the phenomenon is Compton scattering. Scattered X-rays are usually problematic in XRF, creating high levels of background radiation (Anzelmo 1987 Part 1). One exception to this rule involves low-Z elements with fewer electrons. The overall lack of chemical shifts allows the analyst to determine the elemental composition of the sample, whether the elements are present in their pure forms or as compounds (Skoog 1998: 275). Within these two categories is a tremendous variety of differing configurations, X-ray sources and optics, and detector technologies. This paper will cover the most common types of instruments, with forays into the more advanced or specialized components where they are of interest. A detector is angularly scanned relative to the analyzing crystal, registering the spectrum. The detector electronics and data system then build the X-ray spectrum as a histogram, with number of counts versus energy. The source consists of an evacuated chamber with a heated cathode, which is usually a tungsten wire, and an anode, which is held at a potential difference of several tens of kilovolts relative to the cathode. Thermal electrons are released from the cathode and accelerated toward the anode. When the electron beam impinges upon the anode, bremsstrahlung radiation as well as X-ray lines characteristic of the anode material are emitted. These photons escape through a beryllium window built into the side of the tube. X-ray tube powers may be set up at very different levels, from a fraction of a watt for EDXRF instruments with highIn this latter case, the tube must be liquid-cooled since the majority of the power is dissipated as heat. The anode materials must be carefully chosen as well, since the wavelength of their characteristic lines is important for proper excitation of the sample. Some example single-element anode materials are aluminum, chromium, tungsten, palladium, or gold. For detection of light elements, a high intensity of low energy, i.e. 1-10 keV, radiation must be available, while heavy elements require excitation at higher energies up to 50 keV (Jenkins 1995: 43-47, Skoog 1998: 274). It is also important to keep in mind that the primary source of detector background will be the intense primary radiation from the tube, above which the secondary sample radiation must be detected. The use of secondary targets, or filters, can greatly reduce the background and improve sensitivity for specific portions of the spectrum. A tube anode material is chosen to give a high bremsstrahlung or continuum output, which is used to excite a secondary fluorescer, or target, which gives off its own characteristic lines without the continuum.AVANDCIE-AUTOMATION.COM/ckfinder/userfiles/files/Docucentre-C3000-User-Manual.pdf The sample is then excited by the emission from the target, which is chosen to efficiently excite elements in a certain Z range. A system may be set up to change targets automatically during the analysis so that the low, middle, and high end of the sample spectrum may be sequentially boosted. When an EDXRF instrument uses such a system, tube powers must be increased dramatically since most of the original X-ray intensity is lost. Less common excitation sources include gamma-emitting radioisotopes (241Am, 109Cd, 153Gd, and others), electron sources where the sample is the tube anode, and synchrotrons, which produce highly intense, coherent, monochromatic X-ray beams (Jenkins 1988: 56, Jenkins 2000). The development of portable XRF (PXRF) instruments has greatly expanded the range of samples suitable for analysis. There is no longer a need to fit a sample into a small chamber. In the case of PXRF, it is possible to analyze the samples with the instrument in a stand or the instrument can be moved to the sample, as in the case of analyzing a exposed rock outcrop or a large painting. The majority of the samples analyzed by XRF at MURR are small obsidian artifacts that are placed on the nose of the instrument. We have recently acquired an automated sample changer that allows us to load up to 20 samples at a time and operated much like the sample changers on large lab-based instruments. WDXRF spectrometers, however, use an analyzing crystal to disperse the emitted photons based on their wavelength and place the detector in the correct physical location to receive X-rays of a given energy. More collimators, usually made from a series of closely spaced parallel metal plates, are needed to direct the beam in order to closely control the diffraction angle of all detected photons. In the instrument shown, the analyzing crystal may be rotated with the detector assembly simultaneously revolving around it to scan through the possible wavelengths. To resolve wavelengths in all regions, different crystals must be used, since crystals with large spacings must be used for long wavelengths but they make the short wavelengths irresolvable at low q (Jenkins 1995: 89). The gas-flow proportional detector works by placing a high voltage across a volume of gas (usually Ar with methane). An X-ray photon will ionize a number of Ar atoms proportional to its energy. The freed electrons are accelerated in the high voltage, ionizing other Ar atoms and creating an electron cascade which is controlled by the quench gas methane. The freed charges are measured in the circuitry as a voltage pulse whose height is proportional to the energy of the photon that initiated the cascade (Jenkins 1988: 61). This crystal is sealed from light by a Be window. When an X-ray photon enters the crystal, it places primarily the I atoms in an excited state, in numbers again proportional to its energy. These excited states decay exponentially with time, giving off a flash of light or scintillation when they go. The summed intensity of light strikes a photocathode, which releases photoelectrons that are amplified in a discrete dynode detector. The pulse height measured from this detector is proportional to the energy of the original X-ray photon (Jenkins 1995: 96, Knoll 2000). WDXRF spectrometers often offer more flexibility for the researcher as well as very good sensitivities. The detector outputs are also simpler to use directly and do not generally require heavy use of electronics and computer algorithms in order to deconvolute. Disadvantages include the inability to quickly acquire the entire X-ray spectrum for full-element analyses, higher hardware costs, and a larger instrumental footprint when compared to EDXRF systems. Nowadays this is less complicated, though, due to important technological advances in multichannel analyzers and faster computers, and EDXRF is often the technique of choice for fast multielement analyses. Although germanium detectors are utilized, the most common type in service is the Si(Li), or lithium-drifted silicon, detector. A semiconductor detector operates based on the principle that an X-ray photon incident upon the diode material will give up its energy to form electron-hole pairs, the number of which is proportional to the energy of the photon. The high voltage applied across the diode quickly collects the released charge on a feedback capacitor, and the resulting proportional voltage pulse amplified by a charge-sensitive preamplifier. The output of the preamp is fed to a main amplifier system. The pileup rejector, part of this system, deals with the probable event that two pulses will arrive very close together in time. From this point, the pulse is converted to a digital signal and processed in the multichannel analyzer (MCA) (Jenkins 1995). In the MCA, dead time, caused by high counting rates, must be corrected. Peaks in the energy spectrum, once acquired, are subject to a large degree of massaging by the software in the connected computer. Sophisticated algorithms sense and quantitatively correct for high backgrounds due to Compton scattering from low atomic number matrices (Metz 1994). Spectrometers that use secondary targets may acquire several energy spectra for each sample, one from each target. Since each target yields better sensitivity in one part of the spectrum, the information from the energy spectra is combined to quantitate each element being analyzed. Accurate quantitative data on the entire mass spectrum may be obtained in a matter of minutes using EDXRF. However, in general the detection limits are higher than those for WDXRF. With this calibrations it is possible to acquire quantitative concentrations for many elements that are comparable to data acquired by mosre costly and destructive neutron activation analysis (NAA) The tube voltage can be varied up to 45 kV, although we generally analyze the obsidian with a setting of 40kV. The secondary target, or filter, primarily used includes a 6 mil thick sheet of copper (used to block X-rays below about 20kV) a 2 mil sheet of titanium (added to remove the secondary copper X-rays) and a 12 mil sheet of aluminum (to absorb the titanium X-rays). The newly developed sample changer (designed by Dewitt Systems) has a carousel that holds 20 samples. This sample changer has greatly increased our analytical efficiency, allowing us to analyze up to 800 samples per week. An example sample spectrum is presented in Figure 4.Most of the materials we analyze (obsidian, metals, and ceramic paints) do not require any sample preparation. The choice of sample preparation depends on the nature of the X-ray beam relative to the sample. For example, a piece of obsidian that is 1 cm thick and has a clean, flat surface will provide ideal results. As sample sget smaller, thinner, or less homogenous it is necessary to understand the nature of the X-ray beam and how it interacts with the sample. This small beam is fine for homogenous materials, but heterogenous material such as crystalline rocks and tempered pottery may need to be analyzed multiple times in numerous areas to generate a representative average composition. The small beam size is ideal for isolating specific painted elements on the surface of ceramics and also aids in the analysis of very small obsidian artifacts. As a general rule, the higher up the energy spectrum, the greater the depth of X-ray penetration in the sample. For example, the analysis of iron (6.4 kV) in obsidian is primarily a surface analysis while zirconium (15.78 kV) is measured from up to almost a centimeter deep. In thick homogenous samples this depth of analysis makes little difference, but if samples are thinner, it effects to resulting spectrum in different ways depending on the specific sample thickness and particular element of interest. Ferguson (in press) addresses a number of approaches to quantitative analysis of thin samples. We can now analyze large and valuable artifact assemblages that would have been off-limits to destructive proceedures. However, for non-archaeological applications of XRFthe most common method of sample prep is pelletizing, which can be made to work for most matrices that can be ground into an homogeneous powder, including soil, minerals, and dried organic matrices such as tissues or leaves. Difficult grinding is accomplished with a hard agate mortar and pestle but many samples can be adequately homogenized by placing into a hard plastic vial, adding a plastic mixing ball, and violently shaking in a mixer mill. A powdery binder containing cellulose, starch, polyvinyl alcohol or other organics is usually weighed in and blended thoroughly with the sample, and the resulting mixture added to a deformable aluminum cup. (Buhrke p. 39) The sample and cup are pressed in a cylindrical die to form a supported pellet which ideally has a smooth, homogeneous sample surface and good physical stability. This is due to the variance in X-ray penetration depths with energy (Jenkins 1995: 281). Particles may be inhomogeneous also, having a different surface composition than their bulk. For example, copper sulfides may become partially oxidized at the surface, causing the relative absorption for Cu K lines to differ from that of the L lines. The L line photons will not penetrate as deeply and will tend to be emitted more from the oxide layer.Chemical reactions occur within the melt which dissolve particles and create a homogeneous liquid that hardens upon cooling. The disadvantages to this technique include the additional time to prepare the melt and the possibility of the sample reacting with even inert crucible materials such as platinum. Whatever type of preparation is done, the surface roughness of the sample should be taken into account. A rough surface causes the penetration layer to look heterogeneous to the spectrometer.The steel and cement industries routinely utilize XRF devices for material development tasks and quality control. (Anzelmo 1987 Part 1) NIST utilizes XRF as one technique to quantitatively analyze and acceptance-test many of its standard reference materials (SRMs), from spectrometric solutions to diesel fuel to coal to metal alloys (Sieber 2000). The plastics industry is looking at a modified XRF spectrometer as an on-line wear monitor, taking advantage of its ability to detect particles of worn-off metal in extruded plastic pieces (Metz 1994). Polish scientists are accomplishing XRF analyses on very thin films by placing the source and detector at very low angles with respect to the sample. This technique is being applied to trace element determinations in water samples that have been evaporated to a thin film of residue (Holynska 1998). For geologists, the ability to determine major and trace components in one quick analysis with relatively little sample preparation has been a boon (Anzelmo 1987 Part 1, Part 2). Current basic research aimed at improving XRF analyses for geological and ecological samples focuses on methods for correcting for matrix effects, in which major components absorb some of the X-rays emitted from trace components (Revenko 2002). An example of this was the study of the composition of blue soda glass from York Minster, England, which distinguished three compositional groups, indicating this number of possible sources for the glass. Trace metal signatures also can effectively differentiate genuine artifacts from modern copies (Jenkins 2000). As for other applications, here XRF can help elucidate an elemental fingerprint, without need to analyze the evidence destructively (Jenkins 2000). The instruments have few moving parts, tend to be low-maintenance, and on a regular basis consume only liquid nitrogen and electricity.